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Study Guide: Fundamentals of Memory Cells: Technologies and History

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Fundamentals of Memory Cells: Technologies and History Study Guide

Core Concepts of Memory Cells

A memory cell's fundamental role is to store multiple bits of binary information simultaneously.

Answer: False

Explanation: The fundamental function of a memory cell is to store a single binary digit (bit). The capacity to store multiple bits would necessitate a more complex cell architecture or the utilization of multiple cells.

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Sequential circuits, unlike combinational circuits, rely on memory cells to maintain state.

Answer: True

Explanation: Sequential logic circuits, in contrast to combinational circuits, incorporate memory elements to maintain state. Combinational circuits, conversely, produce outputs solely based on current inputs.

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The core function of any binary memory cell is to store a single bit of binary information, regardless of its underlying technology.

Answer: True

Explanation: Irrespective of the implementation technology (e.g., magnetic, semiconductor), the fundamental purpose of a binary memory cell is to store one bit of binary data.

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In sequential logic circuits, 'state' refers only to the current input signal.

Answer: False

Explanation: In sequential logic circuits, 'state' encompasses the history of past inputs and internal configurations, not merely the current input signal. Memory cells are essential for retaining this state information.

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The article details three primary implementations of memory cells: DRAM, SRAM, and flip-flops.

Answer: True

Explanation: The provided material discusses DRAM cells, SRAM cells, and flip-flops (which are fundamental to SRAM) as key implementations of memory cells.

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What does the 'state' of a sequential logic circuit refer to?

Answer: The history of past inputs needed to determine future behavior.

Explanation: The 'state' of a sequential logic circuit encapsulates the information derived from its past inputs and internal configurations, which dictates its subsequent behavior. Memory cells are integral to storing this state.

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Historical Memory Technologies

Magnetic-core memory and bubble memory are examples of modern semiconductor implementations for memory cells.

Answer: False

Explanation: Magnetic-core memory and bubble memory represent historical memory technologies that predated modern semiconductor implementations. Modern memory cells are predominantly based on MOS technology.

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The Williams tube, developed in the 1940s, was an early form of magnetic storage, not random-access memory.

Answer: False

Explanation: The Williams tube, developed in the late 1940s, was one of the earliest practical implementations of random-access memory (RAM), utilizing a cathode-ray tube for storage, not magnetic storage.

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An Wang is credited with developing magnetic-core memory in the late 1940s.

Answer: True

Explanation: An Wang made significant contributions to the development of magnetic-core memory, patenting a coincident-current magnetic core memory system in 1948.

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Flip-flops used as memory cells are typically implemented using bipolar transistors and magnetic cores.

Answer: False

Explanation: Flip-flops, commonly used in SRAM, are typically implemented using semiconductor devices like MOSFETs, forming logic gates. Magnetic cores are a separate historical memory technology.

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What was the significance of the Williams tube in the history of computer memory?

Answer: It was the first practical implementation of random-access memory (RAM).

Explanation: The Williams tube, developed in the late 1940s, represented a significant early advancement by providing the first practical implementation of random-access memory (RAM).

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Who was a key figure involved in the development of practical magnetic-core memory in the late 1940s?

Answer: An Wang

Explanation: An Wang is recognized as a key figure in the development of practical magnetic-core memory, patenting a significant system in 1948.

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What historical memory technology was patented by Freddie Williams in 1946?

Answer: The Williams tube

Explanation: Freddie Williams patented the Williams tube in 1946, which became one of the earliest practical implementations of random-access memory (RAM).

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Evolution to Semiconductor Memory

MOS memory, utilizing MOSFETs and MOS capacitors, is the predominant architecture for memory cells in modern computers.

Answer: True

Explanation: MOS (Metal-Oxide-Semiconductor) memory, which leverages MOSFETs and MOS capacitors, forms the basis for the vast majority of memory cells employed in contemporary computing systems, including DRAM and SRAM.

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Semiconductor memory emerged in the late 1970s, initially facing challenges from magnetic-core memory's lower price.

Answer: False

Explanation: Semiconductor memory, particularly using bipolar transistors, began development in the early 1960s. While it faced price competition from magnetic-core memory, its emergence was earlier than the late 1970s.

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The invention of the MOSFET at Bell Labs in 1960 was insignificant for the development of MOS memory cells.

Answer: False

Explanation: The invention of the MOSFET (Metal-Oxide-Semiconductor Field-Effect Transistor) at Bell Labs in 1960 was a pivotal development, directly enabling the creation and widespread adoption of MOS memory cells.

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John Schmidt designed the first 64-bit p-channel MOS SRAM memory cell in 1964.

Answer: True

Explanation: John Schmidt is credited with designing the first 64-bit p-channel MOS SRAM memory cell in 1964, a significant early milestone in semiconductor memory development.

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The Intel 1103 was the first integrated circuit chip based on bipolar technology, marking a shift from MOS.

Answer: False

Explanation: The Intel 1103, released in 1970, was the first DRAM integrated circuit chip based on MOS technology, not bipolar technology. It represented a significant advancement in MOS memory.

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CMOS memory technology became dominant in the 1980s primarily because it was faster than NMOS from its inception.

Answer: False

Explanation: While CMOS technology offers lower power consumption, early CMOS was not inherently faster than NMOS. Its dominance in the 1980s was achieved through process improvements that allowed comparable speeds with significantly reduced power usage.

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The Intel 1103, released in 1970, was the first DRAM integrated circuit chip based on MOS technology.

Answer: True

Explanation: The Intel 1103, introduced in 1970, holds the distinction of being the first commercially successful DRAM integrated circuit chip manufactured using MOS technology.

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The primary challenge for semiconductor memory in the early 1960s was its superior performance compared to magnetic-core memory.

Answer: False

Explanation: In the early 1960s, semiconductor memory faced challenges primarily related to its higher cost and manufacturing difficulties compared to the established magnetic-core memory, rather than inferior performance.

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The demonstration of a working MOSFET at Bell Labs in 1960 was crucial for the development of magnetic-core memory.

Answer: False

Explanation: The MOSFET's invention was crucial for the advancement of semiconductor memory, particularly MOS memory, not for magnetic-core memory, which was a distinct and preceding technology.

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What invention by Bell Labs in 1960 paved the way for MOS memory cells?

Answer: The Metal-Oxide-Semiconductor Field-Effect Transistor (MOSFET)

Explanation: The successful demonstration of the MOSFET at Bell Labs in 1960 was a foundational event that enabled the subsequent development and widespread use of MOS memory cells.

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What was the significance of the Intel 1103 released in 1970?

Answer: It was the first DRAM integrated circuit chip based on MOS technology.

Explanation: The Intel 1103, launched in 1970, marked a significant milestone as the first DRAM integrated circuit chip manufactured using MOS technology, achieving considerable commercial success.

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What factor led to CMOS memory technology overtaking NMOS in the 1980s?

Answer: Hitachi's twin-well CMOS process achieved comparable speed with lower power consumption.

Explanation: The development of advanced processes, such as Hitachi's twin-well CMOS, enabled CMOS memory to match the speed of NMOS while offering substantially lower power consumption, leading to its dominance in the 1980s.

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What historical challenge did semiconductor memory face when it began development in the early 1960s?

Answer: It struggled to compete with the lower price of magnetic-core memory.

Explanation: In its nascent stages during the early 1960s, semiconductor memory faced significant competition from the established, lower-priced magnetic-core memory, hindering its initial widespread adoption.

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Dynamic RAM (DRAM)

DRAM cells require periodic refreshing because the charge stored in their capacitors can dissipate over time.

Answer: True

Explanation: The charge stored in the capacitors of DRAM cells is subject to leakage, necessitating periodic refreshing to restore the stored data and maintain its integrity.

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Robert H. Dennard's 1966 work led to the development of the single-transistor DRAM memory cell.

Answer: True

Explanation: In 1966, Robert H. Dennard patented the single-transistor DRAM memory cell, which utilized a MOS capacitor for storage, forming the basis for modern DRAM technology.

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Trench-capacitor and stacked-capacitor cells were advancements in 2D memory structures introduced in the mid-1980s.

Answer: False

Explanation: Trench-capacitor and stacked-capacitor cells, introduced in the mid-1980s, represented advancements in three-dimensional (3D) memory structures designed to increase DRAM cell density, not 2D structures.

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The primary storage element in a DRAM memory cell is a capacitor, typically a MOS capacitor.

Answer: True

Explanation: The fundamental storage component within a DRAM memory cell is a capacitor, most commonly implemented as a MOS capacitor, which holds the electrical charge representing a binary state.

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The reading process in a DRAM cell does not affect the stored charge.

Answer: False

Explanation: The process of reading data from a DRAM cell inherently degrades or depletes the stored charge in the capacitor. Consequently, the data must be rewritten immediately after reading to preserve it.

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The nMOS transistor in a DRAM cell acts as a permanent connection, always allowing data access.

Answer: False

Explanation: The nMOS transistor in a DRAM cell functions as a switch controlled by the word line. It is activated to permit data transfer and deactivated to isolate the capacitor for storage, thus it is not a permanent connection.

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A larger bit line capacitance in DRAM design requires a smaller storage capacitor for signal detection.

Answer: False

Explanation: A larger bit line capacitance necessitates a larger storage capacitor in DRAM design to ensure that the voltage change caused by the stored charge is sufficiently detectable by the sense amplifiers.

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The main trade-off in DRAM design involves balancing cell size against the need for a refresh cycle.

Answer: False

Explanation: While cell size is a critical factor, the primary trade-off in DRAM design revolves around balancing storage capacity and density with the need for periodic refreshing due to charge leakage, and ensuring sufficient signal integrity for data retrieval.

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The word line in DRAM and SRAM cells is used to select specific memory cells for access.

Answer: True

Explanation: The word line serves as a control signal in both DRAM and SRAM architectures, activating the access transistors to select and enable access to specific memory cells within a row.

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The bit line in memory cells serves as the primary power supply connection.

Answer: False

Explanation: The bit line functions as the data pathway for reading and writing information to and from the memory cell, not as a primary power supply connection.

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The primary benefit of using a capacitor in DRAM is its ability to hold data indefinitely without power.

Answer: False

Explanation: Capacitors in DRAM cells store data as electrical charge, but this charge dissipates over time due to leakage. Therefore, they cannot hold data indefinitely without power and require periodic refreshing.

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In a DRAM memory cell, what component acts as a switch controlled by the word line?

Answer: The nMOS transistor

Explanation: The nMOS transistor within a DRAM cell serves as a switch, controlled by the word line, to connect or disconnect the storage capacitor from the bit line during read and write operations.

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What is the primary challenge related to bit line capacitance in DRAM design?

Answer: It drains charge, necessitating a larger storage capacitor for detectability.

Explanation: The parasitic capacitance of the bit line can dissipate some of the charge from the storage capacitor, posing a challenge for signal detection. This necessitates a sufficiently large storage capacitor to ensure the resulting voltage change is detectable.

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What is the purpose of the 'word line' in both DRAM and SRAM cells?

Answer: To select specific memory cells by activating access transistors.

Explanation: The word line acts as a selection mechanism, activating the transistors that connect the memory cell's storage element (capacitor in DRAM, flip-flop in SRAM) to the bit lines for data access.

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Which of the following serves as the primary storage element in a DRAM memory cell?

Answer: A MOS capacitor

Explanation: The fundamental storage component in a DRAM memory cell is a MOS capacitor, which stores a binary value as an electrical charge.

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What is the main advantage of using capacitors in DRAM cells?

Answer: They enable very small cell sizes, leading to higher storage densities.

Explanation: The use of capacitors as storage elements in DRAM allows for significantly smaller cell sizes compared to SRAM, resulting in higher storage densities and greater cost-effectiveness for large memory capacities.

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What is the function of the 'bit line' in DRAM and SRAM cells?

Answer: It serves as the pathway for data transfer to and from the cell.

Explanation: The bit line is a critical conductor that facilitates the transfer of data into and out of the memory cell during write and read operations, respectively.

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In a DRAM cell, why is the size of the storage capacitor influenced by the bit line capacitance?

Answer: To ensure the voltage change caused by the stored charge is detectable despite leakage.

Explanation: The bit line's capacitance contributes to signal degradation. The storage capacitor must be sized appropriately to generate a detectable voltage differential on the bit line, compensating for leakage and ensuring reliable data sensing.

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Static RAM (SRAM)

Both Static RAM (SRAM) and Dynamic RAM (DRAM) primarily use floating-gate MOSFETs for data storage.

Answer: False

Explanation: SRAM typically utilizes flip-flops (cross-coupled inverters), while DRAM employs capacitors. Floating-gate MOSFETs are primarily associated with non-volatile memory technologies.

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SRAM cells are generally denser and less expensive than DRAM cells due to their simpler structure.

Answer: False

Explanation: SRAM cells are typically less dense and more expensive than DRAM cells because their structure, often involving six transistors, is more complex than the single transistor and capacitor used in DRAM.

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Floating-gate memory cell architectures are primarily used for volatile memory technologies like SRAM.

Answer: False

Explanation: Floating-gate memory cell architectures are the foundation for non-volatile memory technologies such as EPROM, EEPROM, and flash memory, not volatile technologies like SRAM.

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SRAM memory cells use cross-coupled NAND or NOR gates to maintain their stored state.

Answer: True

Explanation: The fundamental structure of an SRAM cell typically involves cross-coupled inverters, often implemented using NAND or NOR gates, forming a bi-stable latch that maintains the stored state.

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Data is read from an SRAM cell by directly accessing the charge stored in its capacitors.

Answer: False

Explanation: Data in an SRAM cell is read by activating access transistors that connect the bi-stable latch (flip-flop) outputs to the bit lines, allowing the state of the latch to be sensed, not by directly accessing charge in capacitors.

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For a write operation to succeed in SRAM, the access transistors must be smaller than the transistors forming the inverter loop.

Answer: False

Explanation: For a successful write operation in SRAM, the access transistors must be larger than the transistors forming the inverter loop. This ensures that the current supplied through the access transistors can overpower the inverters and flip the stored state.

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The primary advantage of SRAM over DRAM is its ability to store more bits per unit area.

Answer: False

Explanation: DRAM offers higher storage density (more bits per unit area) due to its simpler cell structure (one transistor, one capacitor). SRAM's advantage lies in its speed and lack of refresh requirement, not density.

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SRAM is often used for on-chip cache memory due to its slower access times compared to DRAM.

Answer: False

Explanation: SRAM is utilized for on-chip cache memory precisely because of its *faster* access times compared to DRAM, which is crucial for high-performance processors.

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A standard SRAM cell typically consists of one transistor and one capacitor.

Answer: False

Explanation: A standard SRAM cell is typically more complex, usually comprising six transistors configured as cross-coupled inverters (a flip-flop). A single transistor and capacitor structure is characteristic of DRAM cells.

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The primary benefit of flip-flops in SRAM is their ability to retain data indefinitely without refreshing.

Answer: True

Explanation: Flip-flops, the core of SRAM cells, are bi-stable circuits that can maintain their state indefinitely as long as power is supplied, eliminating the need for the refresh cycles required by DRAM.

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Which of the following memory cell types is primarily based on a bi-stable circuit using cross-coupled inverters?

Answer: SRAM cell

Explanation: SRAM memory cells are fundamentally structured around bi-stable circuits, typically flip-flops formed by cross-coupled inverters, which allow them to maintain a stored state indefinitely.

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How is data typically read from an SRAM cell?

Answer: By activating access transistors to connect the flip-flop outputs to bit lines for sensing.

Explanation: Data is read from an SRAM cell by activating its access transistors, which links the internal flip-flop to the bit lines. The state of the flip-flop is then sensed and amplified from these bit lines.

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What is required for a write operation to successfully flip the stored value in an SRAM cell?

Answer: The access transistors must be larger than the inverter transistors.

Explanation: For a write operation to successfully change the stored value in an SRAM cell, the access transistors must be dimensioned to be larger than the transistors forming the inverter loop, enabling the new data on the bit lines to overpower the existing state.

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What is the primary advantage of SRAM cells over DRAM cells in terms of operation?

Answer: Faster access times due to no refresh requirement.

Explanation: SRAM's primary operational advantage over DRAM is its faster access speed, stemming from its use of flip-flops that do not require periodic refreshing, unlike the charge-based storage in DRAM.

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Why is SRAM commonly used for on-chip cache memory in microprocessors?

Answer: Its faster access times are critical for high-speed operations.

Explanation: The rapid access times characteristic of SRAM make it ideal for on-chip cache memory, where low latency is essential for maintaining high processor performance.

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What is the core structure of a typical SRAM memory cell?

Answer: Two cross-coupled inverters forming a bi-stable circuit.

Explanation: A typical SRAM memory cell is constructed using cross-coupled inverters, creating a bi-stable latch that holds the data state without requiring continuous refreshing.

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What is the typical structure of a standard SRAM memory cell?

Answer: Six transistors configured as cross-coupled inverters.

Explanation: A standard SRAM cell is typically composed of six transistors arranged into cross-coupled inverters, forming a latch that maintains the stored data bit.

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What is the primary benefit of using flip-flops in SRAM cells?

Answer: Ability to hold data indefinitely without refreshing.

Explanation: Flip-flops, employed in SRAM cells, provide the critical ability to retain stored data indefinitely as long as power is supplied, eliminating the need for refresh cycles inherent in DRAM.

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Non-Volatile Memory Technologies

Dawon Kahng and Simon Sze invented the floating-gate MOSFET (FGMOS) for use in volatile memory.

Answer: False

Explanation: Dawon Kahng and Simon Sze invented the floating-gate MOSFET (FGMOS) in 1967, proposing its use for non-volatile, reprogrammable ROM, not volatile memory.

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EPROM and EEPROM are non-volatile memory technologies based on floating-gate memory cells.

Answer: True

Explanation: Both EPROM (Erasable Programmable Read-Only Memory) and EEPROM (Electrically Erasable Programmable Read-Only Memory) are non-volatile memory types that utilize the floating-gate MOSFET architecture for data storage.

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Flash memory was invented by Fujio Masuoka at Toshiba in 1980.

Answer: True

Explanation: Fujio Masuoka, working at Toshiba, is credited with the invention of flash memory, presenting his work in 1980.

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NOR flash was developed before NAND flash, both stemming from Masuoka's invention.

Answer: True

Explanation: Following Masuoka's foundational work on flash memory, NOR flash was presented in 1984, followed by NAND flash in 1987, indicating NOR's earlier development.

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Multi-level cell (MLC) flash memory stores multiple bits per cell, a concept demonstrated in the late 1990s.

Answer: False

Explanation: Multi-level cell (MLC) flash memory, which stores multiple bits per cell, was demonstrated earlier than the late 1990s. For instance, NEC demonstrated quad-level cells (2 bits per cell) in 1996.

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3D V-NAND technology stacks flash memory cells horizontally.

Answer: False

Explanation: 3D V-NAND technology is characterized by stacking flash memory cells vertically, thereby increasing density and performance, rather than horizontally.

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A floating-gate MOSFET stores data by trapping charge in a gate that is electrically isolated by dielectric material.

Answer: True

Explanation: The core principle of a floating-gate MOSFET is the trapping of electrical charge within a gate structure that is completely surrounded by insulating dielectric material, thereby retaining the charge and the stored data.

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The control gate (CG) in a floating-gate memory cell is used to directly store the binary data.

Answer: False

Explanation: The control gate (CG) in a floating-gate memory cell is used to electrically control the injection or removal of charge from the *floating gate*, which is the component that actually stores the data.

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EPROM requires electrical signals to erase its contents, while EEPROM uses ultraviolet light.

Answer: False

Explanation: EPROM (Erasable Programmable Read-Only Memory) requires ultraviolet light for erasure, whereas EEPROM (Electrically Erasable Programmable Read-Only Memory) can be erased using electrical signals, allowing for byte-level erasure.

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Flash memory typically offers lower density and higher cost per bit compared to EEPROM.

Answer: False

Explanation: Flash memory generally provides higher density and lower cost per bit compared to EEPROM, largely due to its block-erasure mechanism and more integrated design.

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Toshiba first announced 3D V-NAND technology in 2007.

Answer: True

Explanation: Toshiba was the first company to announce 3D V-NAND technology, presenting it in 2007.

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Samsung Electronics first commercially manufactured 3D V-NAND technology.

Answer: True

Explanation: While Toshiba announced 3D V-NAND in 2007, Samsung Electronics was the first to bring this technology to commercial production, starting in 2013.

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Flash memory typically erases data in larger blocks, unlike EEPROM which allows byte-level erasure.

Answer: True

Explanation: A key distinction between flash memory and EEPROM is their erasure granularity: flash memory typically erases data in larger sectors or blocks, whereas EEPROM supports byte-level erasure.

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How does a floating-gate MOSFET (FGMOS) store information?

Answer: By trapping charge in an electrically isolated floating gate.

Explanation: FGMOS devices store information by trapping electrical charge within a floating gate, which is insulated by dielectric material. This trapped charge modulates the transistor's threshold voltage, representing the stored data.

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What is the difference between EPROM and EEPROM regarding data erasure?

Answer: EPROM uses ultraviolet light; EEPROM uses electrical signals.

Explanation: EPROM requires exposure to ultraviolet light for erasure, while EEPROM allows for electrical erasure, typically on a byte-by-byte basis, offering greater flexibility.

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What key characteristic distinguishes flash memory from EEPROM?

Answer: Flash memory typically offers higher density and lower cost per bit.

Explanation: Flash memory generally achieves higher density and lower cost per bit than EEPROM, primarily due to its architecture and block-based erasure method, making it suitable for mass storage applications.

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Which technology stacks flash memory cells vertically?

Answer: 3D V-NAND

Explanation: 3D V-NAND technology is specifically designed to stack flash memory cells in a vertical orientation, thereby increasing storage density and performance.

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Who first commercially manufactured 3D V-NAND technology?

Answer: Samsung Electronics

Explanation: Samsung Electronics was the first company to bring 3D V-NAND technology to commercial manufacturing, initiating production in 2013.

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What was the initial proposed application for the floating-gate MOSFET (FGMOS) invented in 1967?

Answer: Reprogrammable ROM (Read-Only Memory)

Explanation: The inventors of the FGMOS, Dawon Kahng and Simon Sze, initially proposed its application for creating reprogrammable ROM devices, leveraging its non-volatile charge storage capability.

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Which of the following is NOT a non-volatile memory technology based on floating-gate cells?

Answer: SRAM

Explanation: SRAM is a volatile memory technology that uses flip-flops for data storage. EPROM, EEPROM, and flash memory are all non-volatile technologies based on the floating-gate principle.

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What is the primary function of the control gate (CG) in a floating-gate memory cell?

Answer: To electrically control the injection or removal of charge from the floating gate.

Explanation: The control gate (CG) is capacitively coupled to the floating gate and is used to apply voltages that facilitate the programming (charge injection) and erasing (charge removal) operations, thereby controlling the stored data.

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Which of the following statements accurately describes flash memory?

Answer: It uses floating-gate technology and usually erases data in large blocks.

Explanation: Flash memory is a non-volatile technology based on floating-gate cells, characterized by its ability to erase data in large blocks, which contributes to its high density and cost-effectiveness.

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